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Hysteresis graph Test System
Product Detailed
Related Categories:Testing Equipment
Related Product Searches:Hysteresis graph Test System,High Quality,Hysteresis graph Test System, measurement instrument,DX-2012SD
Hysteresis graph Test System
Product name: DC Hysteresisgraph
Automatic measurement on hysteresis loop and demagnetization cur
General Features of DC Hysteresis Graph (DX-2012SD)Testing sample varieties: soft magnetic ferrite, permalloy, amorphous, nm crystal, iron dust core, electrician ferrite and stalloy.Testing sample shapes: annular, E and U closing samples, and strip (bar) and chip open samples.Closing sample direct winding measurement: sample, magnetizing coil (N1) and measuring coil (N2) form a no-load transformer.Measure magnetic field intensity through measuring magnetizing current, magnetic field lock precision as high as 0.1%.Adopt electronic integrator to measure magnetic induction, zero drift of integrator can be self-corrected through software.Solenoid or permeameter shall be equipped to measure open samples.Testing method: simulate ballistic method and magnetic field sweep.Adopt analog ballistic method to measure basic magnetization curve, can accurately measure magnetic characteristic parameters on magnetization curve: µi, µm, Bs, value µ of any point.Adopt analog ballistic method and magnetic field sweep to measure saturation hysteresis loop, can accurately measure magnetic characteristic parameters on hysteresis loop: Bs, Br, Hc and Pu. Special explanation: simulate ballistic method to measure hysteresis loop is an exclusive measuring method of our company, can greatly improve the accuracy of Hc and Br.Automatic demagnetisation function before µi testing, 10Hz AC saturation demagnetisation adopted.Testing single parameter can be selected in case of measurement with analog ballistic method to save time, the time of every testing point can be set as 0.1 second ~ 0.9 second.The density of testing point can be self-regulated with B speed feedback according to the shape of sample magnetic characteristic curve, curve can be also tested according to the testing point predefined by users.Powerful software functions with minimal technical requirements for testing staff.Related Product Searches:Hysteresis graph Test System,High Quality,Hysteresis graph Test System, measurement instrument,DX-2012SD
System Specifications
Adopt ballistic method measurement, technical indices as follows:
| Parameters measured | Bs(%) | Br(%) | Hc(%) | Pu(%) | µ m(%) | µ i (%) |
| Uncertainty (k=2) | 1 | 1 | 1.5 | 1 | 2 | 5 |
| Repeatability (constant temperature) | ± 0.5 | ± 0.5 | ± 0.5 | ± 0.5 | ± 1 | ± 3 |
When testing hysteresis loop with scanning method, H and B measuring errors can be estimated as: B: 1% + 1/2 LSB H: 1% + 1/2 LSB
Instrument Specifications
| DX-2012SD Static Hysteresis Graph | PC6616 A/D D/A Card | |
| Output Voltage: 0 ~ ±50VOutput Current: 0.01mA ~ 10ACurrent Range: 1mA, 2mA, 5mA, 10mA, 20mA, 50mA, 100mA, 200mA, 500mA,1A, 2A, 5A, 10A total 13 automatic rangesStability: superior to 0.05%Flux Range: 0.25, 0.5, 1, 2, 5, 10, 20mWb, total seven automatic rangesSensitivity: 0.05µWb (ballistic method)0.1µWb (magnetic field sweep) | A / D Conversion: 16 bits,16 channelsConversion Time: < 10 µsConversion Accuracy: 0.02 %( full range)D/A Conversion: 12 bits, 2 channelsConversion Accuracy: 0.1 %( full range)Bus Structure: PCI busbar |
Hysteresis graph Test System
